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TERS AFM probes new
| Product |
Description |
Price |
| TERS |
TERS probes based on AFM Top Visual cantilevers provide TERS (and AFM) performance in Semicontact/Noncontact mode, uncoated, resonant frequency 200-400 kHz, force constant 25-95 N/m. |
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AFM probe ETALON series new
| Product |
Description |
Price |
| HA_C |
High Accuracy Contact AFM probes HA_C series, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m. |
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| HA_C/Au |
High Accuracy Contact AFM probes HA_C series with Au tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m. |
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| HA_CNC |
High Accuracy Contact AFM probes HA_CNC series, each chip has 2 cantilevers, resonant frequency 46 kHz / 66 kHz, force constant 1.0 N/m / 1.5 N/m. |
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| HA_C/Pt |
High Accuracy Contact AFM probes HA_C series with Pt tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m. |
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| HA_C/tipless |
High Accuracy Contact AFM probes HA_C series without tips, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m. |
HA_C/tipless/50
(50 separated chips):
750 €
( Add to cart)
HA_C/tipless/15
(15 separated chips):
260 €
( Add to cart)
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| HA_FM |
High Accuracy Force Modulation AFM probes HA_FM series, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. |
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| HA_FM/Au |
High Accuracy Force Modulation AFM probes HA_FM series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. |
HA_FM/Au/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_FM/CoFe |
AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with CoFe layer for MFM measurements. |
HA_FM/CoFe/50
(50 separated chips):
1.380 €
( Add to cart)
HA_FM/CoFe/15
(15 separated chips):
495 €
( Add to cart)
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| HA_FM/Pt |
High Accuracy Force Modulation AFM probes HA_FM series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. |
HA_FM/Pt/50
(50 separated chips):
1.020 €
( Add to cart)
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| HA_FM/W2C+ |
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers,resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions. |
HA_FM/W2C/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_HR |
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. |
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| HA_HR/Au |
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. |
HA_HR/Au/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_HR/Pt |
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. |
HA_HR/Pt/50
(50 separated chips):
1.020 €
( Add to cart)
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| HA_HR/W2C+ |
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions. |
HA_HR/W2C/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_NC |
High Accuracy NonContact AFM probes HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. |
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| HA_NC/Au |
High Accuracy NonContact AFM probes HA_NC series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. |
HA_NC/Au/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_NC/Pt |
High Accuracy NonContact AFM probes HA_NC series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. |
HA_NC/Pt/50
(50 separated chips):
1.020 €
( Add to cart)
|
| HA_NC/tipless |
High Accuracy NonContact AFM probes HA_NC series without tips, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 8 N/m / 3.5 N/m. |
HA_NC/tipless/15
(15 separated chips):
260 €
( Add to cart)
HA_NC/tipless/50
(50 separated chips):
750 €
( Add to cart)
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| HA_NC/W2C+ |
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions. |
HA_NC/W2C/50
(50 separated chips):
1.020 €
( Add to cart)
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AFM probes GOLDEN series
| Product |
Description |
Price |
| CSG01 |
Probes for contact mode CSG01 series, resonant frequency 4-17kHz, force constant 0,003-0,13N/m. |
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| CSG01/Au |
Contact SPM probes CSG01 series with Au conductive coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m. |
CSG01/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| CSG01/Pt |
Contact SPM probes CSG01 series with Pt conductive and reflective coatings, resonant frequency 4-17kHz, force constant 0,003-0,13N/m. |
CSG01/Pt/50
(50 separated chips):
1.250 €
( Add to cart)
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| CSG01_tipless |
Contact mode probes of CSG01 series without tips, each chip has one cantilever, resonant frequency 4-17kHz; force constant 0,003-0,17N/m. |
CSG01_tipless/15
(15 separated chips):
470 €
( Add to cart)
CSG01/tipless/50
(50 separated chips):
1.165 €
( Add to cart)
|
| CSG10 |
Probes for contact mode CSG10 series, resonant frequency 8-39kHz, force constant 0,01-0,5N/m. |
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| CSG10/Au |
Contact SPM probes CSG10 series with Au conductive coating, resonant frequency 8-39kHz, force constant 0,01-0,5N/m. |
CSG10/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| CSG10/Pt |
Contact SPM probes CSG10 series with Pt conductive and reflective coatings, resonant frequency 8-39kHz, force constant 0,01-0,5N/m. |
CSG10/Pt/50
(50 separated chips):
1.250 €
( Add to cart)
|
| CSG30 |
NEW PRODUCT! Probes for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0,6-2 N/m.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove. |
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| CSG30/Pt |
NEW PRODUCT!for CONTACT/SEMICONTACT modes CSG30 series with Pt conductive and reflective coatings, resonant frequency 26-76kHz, force constant 0,6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove. |
CSG30/Pt/50
(50 separated chips):
1.250 €
( Add to cart)
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| FMG01 |
for Force Modulation Mode FMG01 series, resonant frequency 40-96kHz, force constant 1-5N/m. |
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| FMG01/Au |
for Force Modulation Mode FMG01 series with Au conductive coating, resonant frequency 47-90 kHz, force constant 1-5 N/m. |
FMG01/Au/50
(50 separated chips):
1.060 €
( Add to cart)
|
| FMG01/Pt |
for Force Modulation Mode FMG01 series with PtIr conductive and reflective coatings, resonant frequency 47-90 kHz, force constant 1-5 N/m. |
FMG01/Pt/50
(50 separated chips):
1.060 €
( Add to cart)
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| MFM01 |
High resolution long lifetime magnetic probes MFM01 series |
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| MFM_HC |
High Coercivity High Resolution Magnetic Probes MFM_HC. |
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| MFM_LM |
Low Moment High Resolution Magnetic probes MFM_LM series |
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| MFMSET/15 |
Set of 15 High resolution long lifetime magnetic probes MFM01, MFM_LM. |
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| NSG01 |
AFM кантилеверы для работы в прерывисто-контактном режиме серии NSG01, резонансная частота 87-230 кГц, постоянная жесткости 1,45-15,1 Н/м. |
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| NSG01/Au |
Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m. |
NSG01/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| NSG01/Pt |
Noncontact SPM probes NSG01 series with PtIr conductive and reflective coatings, resonant frequency 87-230kHz, force constant 1,45-15,1N/m. |
NSG01/Pt/50
(50 separated chips):
1.250 €
( Add to cart)
|
| NSG03 |
AFM probes for noncontact/semicontact modes NSG03 series, resonant frequency 47-150kHz, force constant 0,35-6,1N/m. |
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| NSG03/Au |
for noncontact/semicontact modes NSG03 series with Au conductive coating, resonant frequency 47-150kHz, force constant 0,35-6,1N/m. |
NSG03/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| NSG03/Pt |
Noncontact/semicontact probes NSG03 series with Pt conductive and reflective coatings, resonant frequency 47-150kHz, force constant 0,35-6,1N/m. |
NSG03/Pt/50
(50 зондовых датчиков):
1.250 €
( Add to cart)
NSG03/Pt/15
(15 зондовых датчиков):
420 €
( Add to cart)
|
| NSG10 |
AFM Probes for noncontact/semicontact modes NSG10 series, resonant frequency 140-390kHz, force constant 3,1-37,6N/m. |
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| NSG10/Au |
Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 140-390kHz, force constant 3,1-37,6N/m. |
NSG10/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| NSG10/Pt |
Noncontact SPM probes NSG10 series with PtIr conductive and reflective coatings, resonant frequency 140-390kHz, force constant 3,1-37,6N/m. |
NSG10/Pt/50
(50 separated chips):
1.060 €
( Add to cart)
|
| NSG30 |
AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 240-440kHz, force constant 22-100N/m |
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| NSG30/Au |
noncontact probes NSG30 series with Au conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m. |
NSG30/Au/50
(50 separated chips):
1.250 €
( Add to cart)
|
| NSG30/Pt |
Noncontact probes NSG30 series with PtIr conductive and reflective coating, resonant frequency 240-440kHz, force constant 22-100N/m. |
NSG30/Pt/50
(50 separated chips):
1.060 €
( Add to cart)
|
| NSG30_tipless |
Noncontact/semicontact mode probes of NSG30 series without tips, each chip has 1 cantilever, resonant frequency 240-440kHz; force constant 22-100N/m. |
NSG30_tipless/15
(15 separated chips):
470 €
( Add to cart)
NSG30/tipless/50
(50 separated chips):
1.165 €
( Add to cart)
|
| NSG_L |
Long Type AFM probes for noncontact/semicontact modes NSG_L series, resonant frequency 160-225kHz, force constant 36-90N/m. |
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Cantilever sets
| Product |
Description |
Price |
| MFMSET/15 |
Set of 15 High resolution long lifetime magnetic probes MFM01, MFM_LM. |
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| UNISET/25 |
Cantilever set for contact, noncontact/semicontact, MFM, LAO Lithography, SRM, EFM, SCM, SKM modes. |
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| UNISET/50 |
Cantilever set for contact, noncontact/semicontact, PFM, SRM, EFM, SCM, SKM modes. |
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Super Sharp AFM probes new
| Product |
Description |
Price |
| FMG01_SS |
Super Sharp AFM probes for Force Modulation Mode FMG01 series, resonant frequency 47-90kHz, force constant 1-5N/m, Al reflective coating. |
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| HA_HR_DLC |
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series HA_HR. |
HA_HR_DLC/50
(50 separated chips):
3.940 €
( Add to cart)
|
| NSG01_DLC |
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG01. |
NSG01_DLC/50
(50 separated chips):
3.940 €
( Add to cart)
|
| NSG10_DLC |
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10. |
NSG10_DLC/50
(50 separated chips):
3.940 €
( Add to cart)
|
| NSG30_SS |
Super Sharp AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 200-440kHz, force constant 22-100N/m, Al reflective coating. |
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High aspect ratio AFM cantilevers
| Product |
Description |
Price |
| CSC05_10° |
"Whisker Type" probes for contact modes with whisker inclination angle 10 degree |
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| CSC05_20° |
"Whisker Type" probes for contact modes with whisker inclination angle 20 degree. |
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| FMG01/SCD/5 |
Single crystal full diamond high aspect ratio AFM probes for precise measurements of samples with high particles or deep trenches. Based on FMG01 cantilevers with resonant frequency 40-96kHz, force constant 1-5N/m, Au reflective coating. Tip cone angle is less than 10 degrees. |
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| HA_NC_w10 |
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 10 degrees. |
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| HA_NC_w20 |
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 20 degree |
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| NSC05_10° |
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 10 degrees. |
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| NSC05_20° |
"Whisker Type" probes for noncontact/semicontact modes with whisker inclination angle 20 degree |
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| NSG30/SCD/5 |
Single crystal full diamond high aspect ratio AFM probes for precise measurements of samples with high particles or deep trenches. Based on NSG30 cantilevers with resonant frequency 240-440kHz, force constant 22-100N/m, Au reflective coating. Tip cone angle is less than 10 degrees. |
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TOP VISUAL Probes
| Product |
Description |
Price |
| VIT_P |
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), uncoated. |
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| VIT_P_C-A |
TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m), Al reflective coating. |
VIT_P_C-A/50
(50 separated chips):
1.790 €
( Add to cart)
|
| VIT_P_C/Pt |
TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m) with Pt conductive cover from both tip and reflective sides. |
VIT_P_C/Pt/15
(15 separated chips):
830 €
( Add to cart)
VIT_P_C/Pt/50
(50 separated chips):
2.390 €
( Add to cart)
|
| VIT_P/IR |
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), Al reflective coating. |
VIT_P/IR/50
(50 separated chips):
1.620 €
( Add to cart)
|
| VIT_P/Pt |
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m) with Pt conductive cover from both tip and reflective sides. |
VIT_P/Pt/50
(50 separated chips):
2.390 €
( Add to cart)
VIT_P/Pt/15
(15 separated chips):
1.100 €
( Add to cart)
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SNOM cantilevers new
| Product |
Description |
Price |
| SNOM_C |
SNOM aperture cantilevers for contact mode |
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| SNOM_NC |
SNOM aperture cantilevers for semicontact mode |
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SNOM fiber probes
| Product |
Description |
Price |
| MF001 |
Set of 10 SNOM probes (wavelength 400-550nm), without tuning forks. |
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| MF002 |
Set of 10 SNOM probes (wavelength 450-600nm), without tuning forks. |
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| MF003 |
Set of 10 SNOM probes (wavelength 600-680nm), without tuning forks. |
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| MF004 |
Set of 10 SNOM probes (wavelength 780-970nm), without tuning forks. |
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| MF005 |
Set of 10 SNOM probes (wavelength 980-1600nm), without tuning forks. |
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Calibration Gratings
| Product |
Description |
Price |
| TGG1 |
Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization. |
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| TGQ1 |
Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions. |
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| TGS1 |
Grating set for Z-axis SPM calibration with three different height range - 20nm, 110nm, 520nm. |
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| TGS1F |
Grating set for Z-axis SPM calibration with four different height range - 20nm, 110nm, 520nm, 1400nm. |
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| TGS2 |
Grating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape. |
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| TGSFull |
Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape. |
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| TGT1 |
Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. |
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| TGX1 |
Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio. |
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| TGZ1 |
Calibration grating TGZ1 for SPM Z-axis calibration (step height 20,0±2nm). |
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| TGZ2 |
Calibration grating TGZ2 for SPM Z-axis calibration (step height 110±10 nm). |
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| TGZ3 |
Calibration grating TGZ3 for SPM Z-axis calibration (step height 520±20 nm). |
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HOPG, Substrates, Test Samples
| Product |
Description |
Price |
| DNA01 |
Long-life, stable and non-destructing object for AFM. |
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| GRAS_DS/1.0x10x10 |
HOPG ZYA Quality, double-sided, piece size 10x10mm, thickness 1,0mm |
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| GRAS_DS/1.5x10x10 |
HOPG ZYA Quality, double-sided, piece size 10x10 mm, thickness 1,5mm |
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| GRAS_DS/2.0x10x10 |
HOPG ZYA Quality, double-sided, piece size 10x10 mm, thickness 2,0 mm |
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| GRBS_DS/1.0x10x10 |
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 0,8-1,8 mm |
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| GRBS_DS/1.5x10x10 |
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 1,5 mm |
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| GRBS_DS/2.0X10X10 |
HOPG ZYB Quality, double-sided, piece size 10x10 mm, thickness 2,0 mm |
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| GRHS_DS/1.0x10x10 |
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 0,8-1,8mm |
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| GRHS_DS/1.5x10x10 |
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 1,7mm |
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| GRHS_DS/2.0x10x10 |
HOPG ZYH Quality, double-sided, piece size 10x10 mm, thickness 2,0mm |
|
| Mica/15x15 |
Mica, Squares, 0.15 mm (0.006") thickness, size 15 mm x 15 mm (Package of 20 pieces) |
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| Mica/dia.9,5 |
Mica, Disks, 0.15 mm (0.006") thickness, size 9.5 mm diameter (Package of 20 pieces) |
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| PFM03 |
Test pattern for Piezoresponce Force Microscopy |
|
| SiC/0.75 |
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement
in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
half-monolayer high (0.75 nm) steps. |
|
| SiC/1.5 |
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
monolayer high (1.5 nm) steps. |
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Colloidal probes
| Product |
Description |
Price |
| Colloidal probes for Contact Mode |
5 colloidal probes for Contact mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/SiO2. |
CPC_SiO2-A/Au/5
(5 probes, SiO2 spheres, size 5-9um):
850 €
( Add to cart)
CPC_BSG-A/Au/5
(5 probes, BSG spheres, size 5-9um):
850 €
( Add to cart)
|
| Colloidal probes for Force Modulation Mode |
5 colloidal probes for Force Modulation mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/SiO2. |
CPFM_BSG-A/Au/5
(5 probes, BSG spheres, size 5-9um):
850 €
( Add to cart)
CPFM_SiO2-A/Au/5
(5 probes, SiO2 spheres, size 5-9um):
850 €
( Add to cart)
|
| Colloidal probes for Noncontact/Semicontact Mode |
5 colloidal probes for Nonontact mode, 5-9 um diameter spheres, gold reflective coating, sphere material BSG/Si02. |
CPN_BSG-A/Au/5
(5 probes, BSG spheres, size 5-9um):
850 €
( Add to cart)
CPN_SiO2-A/Au/5
(5 probes, SiO2 spheres, size 5-9um):
850 €
( Add to cart)
|
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