TGS1F

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Grating set TGS1F

Calibration grating set TGS1F is intended for Z-axis calibration of scanning probe microscopes and nonlinearity measurements.
Grating set contains 4 gratings TGZ1, TGZ2, TGZ3, TGZ4 with different step heights.

Grating description
Structure:	- Si wafer - the grating is formed on the layer of SiO2
Pattern types:	1- Dimensional (in Z-axis direction)
Step height:	TGZ1 - 20,0±2 nm* TGZ2 - 110±10 nm* TGZ3 - 520±20 nm* TGZ4 - 1400±10 nm*
Period:	3±0,1 µm
Chip size:	5x5x0.5 mm
Effective area:	central square 3x3 mm

Fig.1 SEM photo of TGZ3 grating

* - the average meaning based on the measurements of 5 gratings with the same height (from the batch of 300 gratings) by AFM calibrated by PTB certified grating set TGS1. Basic step height can vary from the specified one within ±10 % depending on the batch (for example TGZ1 grating can have step height 22±1.5 nm).

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TGS1F

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