ETALON is a new series of excellent composite AFM probes.
In terms of quality-to-price ratio, it has no analogues in the world market.
High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with stable and wear-resistant long lifetime W2C conductive coating.
The main advantages of W2C coated probes are:
Hard coating which stays stable at applied high voltages and flowing currents at the contact point ‘tip-sample’ which cannot be received with standard metal coated probes (Fig.1-3);
High conductivity (close to metal conductivity);
Typical curvature radius less than 35nm;
W2C+ was modified by volume doping with anticorrosion elements thus providing long-term performance in high humidity conditions.
Our investigations in december 2015 approved great stability of W2C+ coated probes under high voltage, current and tip-sample pressure. AFM cantilevers showed to be able measure current of several mkA during the whole scan without any degradation. The same excellent performance continued after 100 I-V curves by the range +/- 10V.
Specification of HA_NC/W2C probe series:
monocrystal silicon tip
| Chip size
|| 3.6 x 1.6 x 0.4 mm
Au (20-30 nm)
W2C (20-30 nm)
| Cantilever number
|| 2 rectangular
| Tip shape
|| Octahedral at the base, conic on the last 200 nm
| Tip cone angle φ
|| 30 degrees on the last 200 nm
| Full tip height
|| ≥10 µm
| Pedestal/tip ratio
| Tip curvature radius
|| less than 35 nm
|Length, L (µm)
|Width, W (µm)
|Thickness, H (µm)
|Force Constant (N/m)
|Resonant frequency (kHz)