VIT_P/IR
 |
VIT_P/IR/50
(50 separated chips):
1.620 €
( Add to cart)
|
| TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series |
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
|
Image in optical microscope
(TOP VISUAL probe is under the investigated sample).
|
Topography image of the sample made by TOP VISUAL probe.
|
|
VIT_P series specification
|
|
Material
|
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
|
|
Chip size
|
3.4x1.6x0.3mm
|
|
Reflective side coating
|
Al
|
|
Front coating
|
None
|
|
Cantilever number
|
1 rectangular
|
|
Tip curvature radius
|
typical 30nm
|
|
Tip shape
|
Pyramidal
|
|
Tip height
|
14-16 um
|
|
Cantilever series
|
Cantilever length, L±5µm
|
Cantilever width, W±3µm
|
Cantilever thickness,
T±0.5 µm
|
Resonant frequency, kHz
|
Force constant, N/m
|
|
min
|
typical
|
max
|
min
|
typical
|
max
|
|
VIT_P/IR
|
140
|
50
|
5.0
|
200
|
300
|
400
|
25
|
50
|
95
|
