HA_FM/W2C+
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HA_FM/W2C/50
(50 separated chips):
1.020 €
( Add to cart)
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ETALON is a new series of excellent composite AFM probes.
In terms of quality-to-price ratio, it has no analogues in the world market.
High Accuracy High Resonance frequency noncontact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating.
The main advantages of W2C coated probes are:
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Hard coating which stays stable at applied high voltages and flowing currents at the contact point ‘tip-sample’ which cannot be received with standard metal coated probes (Fig.1-3);
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High conductivity (close to metal conductivity);
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Typical curvature radius less than 35nm;
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W2C+ was modified by volume doping with anticorrosion elements thus providing long-term performance in high humidity conditions.
Our investigations in december 2015 approved great stability of W2C+ coated probes under high voltage, current and tip-sample pressure. AFM cantilevers showed to be able measure current of several mkA during the whole scan without any degradation. The same excellent performance continued after 100 I-V curves by the range +/- 10V.
Specification of HA_FM/W2C probe series:
| Material |
Polysilicon lever,
monocrystal silicon tip
|
| Chip size |
3.6 x 1.6 x 0.4 mm |
|
Reflective side
Tip side
|
Au (20-30 nm)
W2C (20-30 nm)
|
| Cantilever number |
2 rectangular |
| Tip shape |
Octahedral at the base, conic on the last 200 nm |
| Tip cone angle φ |
30 degrees on the last 200 nm |
| Full tip height |
≥10 µm |
| Pedestal/tip ratio |
1:1 |
| Tip curvature radius |
less than 35 nm |
| Cantilever type |
A |
B |
Typical dispersion |
| Length, L (µm) |
223 |
183 |
± 2 |
| Width, W (µm) |
34 |
34 |
± 3 |
| Thickness, H (µm) |
3 |
3 |
± 0.15 |
| Force Constant (N/m) |
3.5 |
6 |
±20% |
| Resonant frequency (kHz) |
77 |
114 |
± 10%
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