NSG30/Pt
|
NSG30/Pt/50
(50 separated chips):
1.060 €
( Add to cart)
|
High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series with PtIr conductive coating
PROBES GENERAL INFORMATION
NSG30/Pt series specification
|
Material
|
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
|
Chip size
|
3.4x1.6x0.3mm
|
Reflective side
|
Pt
|
Conductive coating
|
PtIr (25nm), Cr adhesion layer (25A)
|
Cantilever number
|
1 rectangular
|
Tip curvature radius
|
~ 35nm
|
Also available coatings
|
conductive TiN, Au
|
Available NSG30 probes
|
bare, tipless, with Al reflective coating
|
|
|
Cantilever series
|
Cantilever length, L±5µm
|
Cantilever width, W±3µm
|
Cantilever thickness,
T±0.5 µm
|
Resonant frequency, kHz
|
Force constant, N/m
|
min
|
typical
|
max
|
min
|
typical
|
max
|
NSG30
|
125
|
40
|
4.0
|
240
|
320
|
440
|
22
|
40
|
100
|