NSG03
| High Resolution NONCONTACT "GOLDEN" Silicon AFM probes NSG03 series |
PROBES GENERAL INFORMATION
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NSG03 series specification
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Material
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Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
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Chip size
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3.4x1.6x0.3mm
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Reflective side
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Au
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Cantilever number
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1 rectangular
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Tip curvature radius
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typical 6nm, guaranteed 10nm
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Available coatings
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conductive PtIr, TiN, Au;
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Available probe
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bare, tipless, with Al reflective coating
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Cantilever series
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Cantilever length, L±5µm
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Cantilever width, W±3µm
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Cantilever thickness,
T±0.5 µm
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Resonant frequency, kHz
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Force constant, N/m
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min
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typical
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max
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min
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typical
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max
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NSG03
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135
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30
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1.5
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47
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90
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150
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0.35
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1.74
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6.1
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