17.05.2016, Workshop Announcement Rome Italy 2016
NT-MDT is excited to announce an upcoming workshop for Italian customers to be held in Rome, Italy June 17th 2016. The Workshop will take place at the GRAND HOTEL PALATINO, Rome, Italy, June 17th 2016 focusing on techniques of AFM, Raman and Techniques of Advanced AFM, Super resolution imaging – Tip Enhanced Raman Scattering (TERS).
During this arrangement CEO of NT-MDT America., Dr. Sergey Magonov (CEO of NT-MDT America), will present a talk on Compositional imaging of complex materials with atomic force microscopy. Our application scientist, Dr Sergey Lemeshko, will also present a talk on reliable TERS probes based on Si-cantilevers for nanoRaman imaging and nano-IR sSNOM.
As a practical part we will provide and demonstrate measurements on the Ntegra Platform, and TITANIUM devices.
On our main web site you may find more information about the workshop and our contact persons.
16.05.2016, Upcoming webinar of Dr. Stanislav I. Leesment
25 of May 2015 the new webinar of Dr. Stas Leesment will take place. During this webinar various examples of common image processing procedures such as flattening, filtering, etc. will be described and the ways of perceptual data representation will be shown.
To find more information about the webinar and to pass the registration procedure, please, visit "Webinars" section of our web-site.
16.05.2016, NTEGRA Spectra II - automated AFM-Raman, SNOM and TERS system
NT-MDT is delighted to introduce our new product NTEGRA Spectra II. Owing to Tip Enhanced Raman Scattering (TERS) the new model allows carrying out spectroscopy/microscopy with nanometer scale resolution.
Scanning near-field optical microscopy (SNOM) is another approach to obtain optical and spectroscopy images of optically active samples with resolution limited by probe aperture size (~ 100 nm).
To find more information about applications, working principles and technical specifications of NTEGRA Spectra II you may visit its section on our web-site.