AFM, SNOM, TERS probes, test samples & calibration gratings

The 2018 E-MRS Fall Meeting and Exhibit will be held in Warsaw University of Technology, from September 17 to 19 (exhibition) and September 17 to 20 (technical sessions).

The conference will consist of 21 parallel symposia with invited speakers, oral and poster presentations and a plenary session to provide an international forum for discussing recent advances in the field of materials science.

NT-MDT Spectrum Instruments is excited to extend an exclusive invitation for you to visit us at
ACS Fall Meeting & Exposition 2018 August 19-23 in Boston, Massachusetts.
Visit us at Booth 1228 where our experts will be happy to introduce our unique HD PFM mode for fragile and soft materials. Bring your samples, ask questions, try out live fully automated AFM and don’t forget to pick up your exclusive souvenirs.

The webinar took place on Thu, Jan 18, 2018 8:00 AM PST

Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation in the spatial resolution. Integration of both techniques overcomes this gap. On the webinar we will discuss the basics of technology, as well as the advanced features provided by the deep integration of AFM & Raman. Recent results published in prestigious scientific journals will be discussed.

NT‑MDT SI was the first company to introduce the commercially available AFM-Raman system in 1998. Since then, NT‑MDT SI has been a world leader in integrated solutions for AFM-Raman and TERS with more than 260 installations worldwide.

Please find the webinar record and presentation following this link.