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AFM, SNOM, TERS probes, test samples & calibration gratings

Enhance your AFM to a new, unrivaled level
Leading the way in nanoscale analysis

Latest news

28.09.2021, NT-MDT Spectrum Instruments is proud to announce its participation in Graphene2021 Conference

The 11th edition of Graphene Conference series, the largest European Event in Graphene and 2D Materials, will be organized in Grenoble (France): October 26-29, 2021. Over the past editions, the Graphene Conference strengthened its position as the main in-person meeting point of the Graphene community Worldwide.
Come and visit our Booth to speak to one of our experts.

For more information on upcoming NTMDT S.I. events and exhibitions
please follow link: www.ntmdt-si.com/about/events

27.09.2021, NT-MDT Spectrum Instruments is proud to announce its participation as a sponsor in MNNSI-2021 Conference

The Modern nanotechnologies and nanophotonic for science and industry conference MNNSI-2021 (http://mnnsi.interconf.pro/) will be held offline from the 11th to the 16th of November 2021 with on-line web broadcasting.

For more information on upcoming NTMDT S.I. events and exhibitions
please follow link: www.ntmdt-si.com/about/events

05.04.2021, NT-MDT Spectrum Instruments has prepared a scientific digest on PFM

Piezoresponce Force Microscopy (PFM) is an AFM mode which probes the mechanical deformation of a sample in response to an electric field which is applied between tip and sample. It allows to visualize ferroelectric domains, perform direct measurement of piezoelectric coefficients, study the dynamics of domain walls, etc. with high spatial resolution. These studies are essential for understanding the nature of new functional materials and devices for optoelectronics, data storage, medical diagnostics, actuators, etc. In this scientific digest we present the collection of most remarkable works done by the world leading scientific groups during last two years in the field of PFM with the help of our instrumentation.

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