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27.11.2016, MRS 2016

NT-MDT Spectrum Instruments is excited to take part at MRS Fall Meeting & Exhibit 2016 November 27 – December 2 in Boston, Massachusets.

Location: Hynes Convention Center
Level 2,
900 Boylston Street
Boston, Massachusetts 02115
Booth Number: 923

The increasingly cross-disciplinary worldwide activity in materials research manifests itself every year in the MRS Fall Meetings. Featuring over 50 symposia and attended by as many as 6,000 researchers from every corner of the globe, the annual Fall Meeting in Boston’s Hynes Convention Center and Sheraton Boston Hotel is the preeminent annual event for those in the field of materials research.

Please, visit us at Booth 923. Our engineers will be glad share with you our news and latest developements, to demostrate work of our AFM equipment and to provide our visitors free samples of Golden (NSG10, CSG01) and Etalon (HA_NC, HA_C) series cantilevers.

2016 MRS Fall Meeting


27.09.2016, Single crystal diamond AFM probes with high aspect ratio


We’re glad to present the new product in our assortment: AFM cantilevers with single crystal diamond (SCD) tips. This type of probes is represented by a very narrow diamond (CVD-grown) needle glued to a standard tipless Si cantilever.

AFM probes prepared by such technology show several features, especially relevant to AFM scans:

  • SCD tip’s cone angle is less than 10 degrees. Thus a diamond needle will get into deep trenches and between high particles, providing detailed topography images.
  • Single crystal diamond tip’s end is very hard. As the result wear of such cantilevers is several times slower than for standard silicon ones. Low deformation of a tip will be the great utility for elasticity investigations and simple nanoindentation or force lithography experiments.
  • SCD tip has got low surface energy and it works well for sticky biological samples.

SCD AFM cantilevers are constantly used by our best application scientists: Sergey Magonov and Marko Surtchev. Thus we’re absolutely sure in quality of these probes.

To the right you can see a scan of so-called “Black silicon” relief. Such surface can be constructed by a special etching experiment and is used in solar cells.

Main challenges in visualization of “black silicon” pyramids are their heights that reach 6-7 um. Standard cantilever can’t get between such high and densely grown structures. But as the one may see from the scan, SCD probes worked well. Sharp pyramid’s shape and well-defined flat areas between them approve high quality of the scan.

Now SCD cantilevers are presented in our assortment by the models NSG30/SCD and FMG01/SCD with the same lever’s parameters as for corresponding ones of Golden series. But by the request SCD needles can be glued to any types of tipless cantilevers of Golden and Etalon series.

Also we provide an additional discount 15% for any models of SCD probes till the end of October 2016.

29.08.2016, NT-MDT microscopes were involved into more than 1000 scientific researches in 2015
Over 1000 articles written with help of NT-MDT microscopes were published in year 2015 in top scientific journals with average impact factor of 3,2. List of selected papers can be found here.

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