AFM, SNOM, TERS probes, test samples & calibration gratings

The webinar took place on Thu, Jan 18, 2018 8:00 AM PST

Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation in the spatial resolution. Integration of both techniques overcomes this gap. On the webinar we will discuss the basics of technology, as well as the advanced features provided by the deep integration of AFM & Raman. Recent results published in prestigious scientific journals will be discussed.

NT‑MDT SI was the first company to introduce the commercially available AFM-Raman system in 1998. Since then, NT‑MDT SI has been a world leader in integrated solutions for AFM-Raman and TERS with more than 260 installations worldwide.

Please find the webinar record and presentation following this link.

NT-MDT Spectrum Instruments proudly exhibited at the recent MRS Fall Meeting & Events 2017. The Conference took place at the Hynes Convention Centre, Boston MA in which NT-MDT SI Exhibited at Booth Number 523-525.The conference is organised by Materials Research Society with the aim to provide international forums for the presenting the scientific results in the field of materials by scientists, acadamians, industries as well as regional and international. The MRS Meetings provide the opportunity to promote collaboration and cooperation between scientists and academia. At this event we saw World-Class speakers deliver very interesting talks, workshops take place and poster awards been presented.

Mr Oleg Butyaev Sales Manager responsible for the US Market along with our other technical experts were available throughout this conference to meet with Scientists and Academia that travelled many miles to attend the MRS Fall Meeting & Exhibit 2017. Onsite demonstrations took place where attendees were able to bring samples and we could deliver results in real time. Presented at the booth was our NEXT II system which is easy to use technology enabling multiple AFM/STM capabilities and delivering world class performance.

NT-MDT SI would like to invite you to visit our company website for more information on our unique systems by following this link http://www.ntmdt-si.com/automated-afm/atomic-force-microscope-next

To find out more information about upcoming webinars and events please go to http://www.ntmdt-si.com/

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