AFM, SNOM, TERS probes, test samples & calibration gratings
21.02.2019, APS MARCH MEETING 2019, BOOTH #732
NT-MDT Spectrum Instruments is excited to extend an exclusive invitation for you to visit us at
APS March Meeting 2019 March 04 – 08 in Boston, Massachusets.
NT-MDT Spectrum Instruments is taking part in APS 2019 meeting in #Boston. You are kindly welcome to our booth #732.
Get in touch with our experts and find out how you can improve the performance of your AFM by means of intellectual ScanTronic software.
Location: Boston Convention and Exhibition Center
Booth Number: 732
For more information on the MRS Fall Meeting please go to https://www.aps.org/meetings/march/
We look forward to meeting you at this exciting event!
30.01.2019, Webinar ScanTronic™: a Shortcut to Reliable AFM Results. February 20, 2019
NT-MDT Spectrum Instruments is excited to invite you to our first webinar ‘2019:
"ScanTronic™: a Shortcut to Reliable AFM Results"
Atomic Force Microscopy is a widely used and powerful technique for investigating materials at a nanoscale range. However, the technique is not simple to use, which elicits varied results between researchers with different levels of experience. Inspired by neural networks we have created the intelligent ScanTronic™ software to make amplitude modulation AFM (AM-AFM) easy for researchers of every skill level.
During the webinar the multiple examples how ScanTronic™ helps to avoid common AM-AFM artifacts will be introduced.
Webinar will take place on Wednesday, February the 20th 4 PM-5 PM GMT (8 AM-9 AM PST).
20.12.2018, XXIII Symposium “Nanophysics and Nanoelectronics”
Starting from 1997-1998 the annual International Symposium «Nanophysics and Nanoelectronics” continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscopy with the participation of all research groups in Russia, actively working in this field and with the participation of scientists from abroad.