AFM, SNOM, TERS probes, test samples & calibration gratings

NT-MDT Spectrum Instruments is excited to invite you to webinar: 
“AFM-Raman, SNOM and TERS: Recent Advances and Applications”

Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation - the spatial resolution. Integration of both techniques overcomes this gap. In our webinar we will review the latest advances in this area based on recently published papers in high-ranked scientific journals and give the examples of various solutions implemented within legendary NTEGRA SPECTRA system. Please check your local time zone at the registration page.

Starting from 1997-1998 the annual International Symposium «Nanophysics and Nanoelectronics” continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscopy with the participation of all research groups in Russia, actively working in this field and with the participation of scientists from abroad.

NT-MDT Spectrum Instruments is excited to extend an exclusive invitation for you to visit us at
APS March Meeting 2019 March 04 – 08 in Boston, Massachusets.

NT-MDT Spectrum Instruments is taking part in APS 2019 meeting in #Boston. You are kindly welcome to our booth #732.
Get in touch with our experts and find out how you can improve the performance of your AFM by means of intellectual ScanTronic software.

Location: Boston Convention and Exhibition Center
Boston, MA
Booth Number: 732

For more information on the MRS Fall Meeting please go to   https://www.aps.org/meetings/march/

We look forward to meeting you at this exciting event!