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AFM, SNOM, TERS probes, test samples & calibration gratings
Enhance your AFM to a new, unrivaled level
   Leading the way in nanoscale analysis Latest news
05.02.2020, XXIV SYMPOSIUM “NANOPHYSICS AND NANOELECTRONICS”
Starting from 1997-1998 the annual International Symposium "Nanophysics and Nanoelectronics" (nanosymp.ru/en/about) continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscopy with the participation of all research groups in Russia, actively working in this field and with the participation of scientists from abroad. more infoThe Symposium scientific thematic covers a wide range of subjects of Condensed Matter Physics, its relevance is dictated by the large number of papers in this field in Russia and abroad, this trend is one of priority directions of science, technology and engineering in Russia. Honorary President of NT-MDT Spectrum Instruments Bykov Victor Alexandrovich (Moscow, Russia) will make a guest report “From the first STM to nanotechnological systems for complex surface analysis - 30 years of experience in development and development” at the session in area “Measurements and technologies of atomic and nanometer scale based on probe, electron-beam and ion-beam methods”
04.02.2020, Webinar “NTEGRA Marlin: Bringing SICM to Your Research”
NT-MDT Spectrum Instruments is happy to invite you to our new webinar “NTEGRA Marlin: Bringing SICM to Your Research”. Introduced more than 3 decades ago by Hansma et al., Scanning Ion Conductance Microscopy (SICM) has been developed by different groups and companies. However, the progress of SICM becoming a common tool for studies at the nanoscale, like one that happened to AFM, was quite slow due to different technological reasons. The technological breakthrough was introduced by group of scientists and engineers lead by Prof. Yuri Korchev. Honed in electrical, software and mechanical aspects SICM has become enough fast, reliable and simple to be used in common applications. Combined with NT-MDT technologies the system has been empowered by combination with AFM and Raman and introduced as a joint product of NT-MDT Spectrum Instruments and ICAPPIC Inc. as NTEGRA Marlin. During the webinar, our lecturer Prof. Korchev will introduce a wide range of SICM applications to biological and local electrochemical studies. Webinar will take place on Tuesday, March the 17th 4-5 PM GMT (9-10 AM PST). Presenter: Prof. Yuri Korchev, Imperial College London Please check your time zone at the registration page.
04.02.2020, ACS NATIONAL MEETING & EXPO, BOOTH #930
NT-MDT Spectrum Instruments is delighted to announce our participation at ACS National Meeting & Expo which will be held in Philadelphia, PA, USA from the 22th to 26th of March 2020. more infoThe American Chemical Society National Meeting is where chemistry professionals meet to share ideas and advance scientific and technical knowledge. During the meeting, scientists present new multidisciplinary research, hear the latest information in their areas of professional interest, and network with colleagues. Come and visit our Booth #930 to speak to one of our experts and get a unique look at our devices in operation. Visit the ACS Meeting website by clicking the following link: acs.org/content/acs/en/meetings/national-meeting.html For more information on upcoming NT-MDT Spectrum Instruments events and exhibitions please follow link: www.ntmdt-si.com/about/events |
