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High aspect ratio AFM cantilevers

High aspect ratio AFM cantilevers are supposed to be used for obtaining high-quality images of high particles and deep trenches on a surface. Their tip's cone angle is usually less then 10 degrees. That allows a tip to get into narrow gaps between particles making excellent topography detalization. This type of probes is presented in our assortment by two models.

"Whysker-type" AFM cantilevers are being made by growing a long carbin needle at the end of the standard silicon tip. Such "additional" probe may be also inclined under 10 or 20 degrees to a tip (thus directing straight perpendicular to a surface after being placed in a standard probe's holder of most of commercial AFMs)

Single crystal diamond high aspect ratio cantilevers are presented by a full diamond narrow needle attached to a tipless cantilever. This attachment is very strong and the probe can hold many scans without being destroyed by a tip-sample interaction.

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