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AFM probe ETALON series new

ETALON is a new series of excellent composite AFM probes with two cantilevers on each chip.

In terms of quality-to-price ratio, it has no analogues in the world market.
 
 
New Brand Technology of NT-MDT Combines All Critical Advantages in One Chip:
• Sharp tip (curvature radius less than 10 nm).
• Resonance frequency, specified with high accuracy (±10%).
Two levers on one chip.
• Special chip geometry for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.

Highly Specified Resonance Frequency
The ETALON Series probe have two polysilicon levers with
a pedestal and monocrystal silicon tips.
Precision  technology of polysilicon deposition guarantees the lever thickness control.
A special frequency stabilizer is designed to make the dispersion of the resonant frequency and force constant smaller (due to the lever length control).
Thanks to the above mentioned facts, the ETALON probes are characterized by highly reproducible parameters:
• Typical dispersion of the lever thickness: ±0.15 μm
• Typical dispersion of the lever length: ±2 μm
• Typical dispersion of the probe resonant frequency: ±10%
• Typical dispersion of the force constant: ±20%.

 

Comparison between ETALON and silicon probes

Parameters ETALON probes Silicon cantilevers

Thickness dispersion of the cantilever

± 0.15 µm ± 0.5 µm

Length dispersion of the cantilever

± 2 µm ± 10 µm

Resonant frequency dispersion

± 10% till ± 100%

 

SCAN-GALLERY  of the Images obtained by ETALON Probes

 

AFM cantilevers ETALON series for Noncontact/Semicontact/Force Modulation Modes with wide range of resonant frequencies and force constants.
Supplied with Au reflective coating, available without tips, with no coatings, with Pt conductive coating.

AFM cantilevers ETALON series for Contact Mode.
Supplied with Au reflective coating, available without tips, with no coatings, with Pt conductive coating.

Stable and nondestructive, wear resistant probes with highlt doped diamond coating for long-term electrical measurements.

AFM cantilevers ETALON series for Conductive modes (SCM, SKM, SRI, EFM, I-V curve spectroscopy, voltage lithography) with Pt conductive coating, supplied with wide range of resonant frequencies and force constants.

 

AFM probes for Magnetic mode (MFM) with CoFe magnetic coating.

AFM cantilevers without tips.

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