June 2018 special offer
Webinar "AFM integration with Laser Spectroscopy: Challenges, Solutions, Advantages"
The webinar took place on Thu, Jan 18, 2018 8:00 AM PST
Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation in the spatial resolution. Integration of both techniques overcomes this gap. On the webinar we will discuss the basics of technology, as well as the advanced features provided by the deep integration of AFM & Raman. Recent results published in prestigious scientific journals will be discussed.
NT‑MDT SI was the first company to introduce the commercially available AFM-Raman system in 1998. Since then, NT‑MDT SI has been a world leader in integrated solutions for AFM-Raman and TERS with more than 260 installations worldwide.
Please find the webinar record and presentation following this link.
MRS Fall Meeting and Exhibit 2017
NT-MDT Spectrum Instruments proudly exhibited at the recent MRS Fall Meeting & Events 2017. The Conference took place at the Hynes Convention Centre, Boston MA in which NT-MDT SI Exhibited at Booth Number 523-525.The conference is organised by Materials Research Society with the aim to provide international forums for the presenting the scientific results in the field of materials by scientists, acadamians, industries as well as regional and international. The MRS Meetings provide the opportunity to promote collaboration and cooperation between scientists and academia. At this event we saw World-Class speakers deliver very interesting talks, workshops take place and poster awards been presented.
Mr Oleg Butyaev Sales Manager responsible for the US Market along with our other technical experts were available throughout this conference to meet with Scientists and Academia that travelled many miles to attend the MRS Fall Meeting & Exhibit 2017. Onsite demonstrations took place where attendees were able to bring samples and we could deliver results in real time. Presented at the booth was our NEXT II system which is easy to use technology enabling multiple AFM/STM capabilities and delivering world class performance.
NT-MDT SI would like to invite you to visit our company website for more information on our unique systems by following this link http://www.ntmdt-si.com/automated-afm/atomic-force-microscope-next
To find out more information about upcoming webinars and events please go to http://www.ntmdt-si.com/
Rebirth of Force Spectroscopy: HybriD AFM Mode
NT-MDT S.I. is happy to present a new group of AFM and AFM-Optical combined modes based on fast force spectroscopy – HybriD mode (HD mode). Combination of the fast force spectroscopy with cutting-edge AFM and optical techniques opens-up absolutely new opportunities of AFM equipment.
In this webinar we will show the advantages of HD mode for fast quantitative nanomechanical and topography measurements, non-destructive conductive, piezoelectric, thermoelectric and thermal studies, cantilever-type TERS and scattering SNOM.
The webinar will take place on Wednesday, 15th of November 2017 8:00 AM – 9:00 AM PST
Please check your time zone at the registration page!
NT-MDT Spectrum Instruments is happy to invite you to take part in AFM Image Contest - 2017!
NT-MDT Spectrum Instruments is delighted to announce AFM Image Contest 2017!
We would like to invite you to take part in our contest, share your beautiful results within the community and get valuable prizes!
First Prize: Exclusive set* of 50 AFM Probes compiled according to your needs. Winner image will also be promoted on the upcoming International Exhibition “The fascination of NanoWorld” being held on 2nd – 16th of December in Venice.
Second Prize: Exclusive set* of 30 AFM Probes compiled according to your needs
Third Prize: Exclusive set* of 15 AFM Probes compiled according to your needs
All participants will receive a personal 10% discount** to use for purchases on our online AFM Probes Shop www.ntmdt-tips.com
The Chosen images will also be used in the NT-MDT Spectrum Instruments Calendar 2019!
If you would like to take part in this Contest please follow these simple steps:
- Follow us on Facebook: https://www.facebook.com/NTMDT/
- Upload your AFM image in your profile promoting it with the following hashtags: #NTMDT & #NTMDTContest2017
- Provide an image description:
- Name – how would you name your image?
- Image size – if not specified on scales
- Mode – mode the image was captured
- Sample courtesy – name of person or institution which provided you with the sample (in case the sample wasn’t prepared by you)
- Probe type – probe type used to capture the image
- Any additional information: scientific value of the image, reference to papers, etc. Anything you consider to be important.
- Send an e-mail with “AFM Image Contest 2017” in the subject field to firstname.lastname@example.org. Provide the following following information:
- Your name
- Your position
- Institution name
- Your AFM model
- Link to your personal Facebook account
- Collect Likes, surf through other works using #NTMDTContest2017 hashtag and wait for results!
Winners will be determined on November, the 17th 2017 at 1pm BST according the number of Emotions (“Likes”, “Hearts”, “Haha-s” and even “Angries”) collected under the original post.
Rules & Regulations:
- Number of images submitted to the contest is unlimited. Each image should be presented in separate post accompanied with corresponding hashtags.
- All images should be acquired with the use of NT-MDT equipment.
- The submitter must be involved in the generation of the image and must obtain permission for its use in this contest from any colleagues who participated in its generation.
- NT-MDT Spectrum Instruments reserves the right to use any submitted image for promotional purposes (with credit to author).
- Submitter agrees to provide NT-MDT Spectrum Instruments data source file in *.mdt format if required.
- Coloration and representation of image (2D/3D/2D Shading) is up to Author.
- Contest finishes and results are calculated on November, the 17th 2017 at 1 PM BST. Information about winners will be sent via e-mail and announced via NT-MDT SI information and social media accounts.
- This contest is in no way endorsed, supported, affiliated or administered by Facebook. The information you provide will only be used for this contests purposes. Prize pack has no cash value equivalent.
- The official page of "AFM Image Contest 2017":
All questions regarding Contest can be addressed to email@example.com mail account. Please use “Question CONTEST2017” subject.
Looking forward to your wonderful images!
NT-MDT SI Team
* Choice of probes is limited by following models:
CSG01, CSG01/Au, FMG01/Pt, FMG01/TiN, MFM_HC, MFM_LM, NSG03/Au, NSG30/Au, HA_FM, NSA30
Each set can contain not more than 15 probes of each type
**Exclusive 10% discount is valid till 30 Dec. 2017
NT-MDT SI Participates at E-MRS Fall Meeting and Exhibit 2017
NT-MDT Spectrum Instruments were proud to participate at E-MRS Fall Meeting 2017 Warsaw, Poland September 18th – 21st. From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.
The E-MRS Fall Meeting and Exhibit 2017 took place in Warsaw University of Technology. The conference consisted of 23 parallel symposia with invited speakers, oral and poster presentations and a plenary session to provide and international forum for discussing recent advances in the field of material science. NT-MDT Spectrum Instruments technical experts welcomed visitors at our Booth # 6, which provided the opportunity to discuss new developments and provide personal one to one discussions.
NT-MDT SI was also delighted to sponsor the Exhibitor Symposia “Scanning Probe Microscopy for energy applications”. This symposium gave attendees the opportunity to meet industry in a more personalized environment. Dr Stanislav Leesment delivered a talk titled “Material contrast mapping with nanometer resolution” which took place on Tuesday September 19th at 10:10am.
NT-MDT SI would like to take this opportunity to sincerely thank all those that visited our booth at E-MRS Fall 2017 and look forward to meeting you at future Events & Workshops.
To find out more information about Upcoming Events please follow this link http://www.ntmdt-si.com/
Termination of employment agreement with European regional sales manager Mr. Dmitry Kozodaev
NT-MDT SI announces the termination of its employment agreement with Mr. Dmitry Kozodaev, our European regional sales manager, effective from April 1st 2017.
We would like to thank Mr. Dmitry Kozodaev for his service over the past 10 years and wish him good luck with his recently developed company.
NT-MDT SI does not take any responsibility for any requests/orders/supplies from Techno-NT or Mr. Dmitry Kozodaev, and strongly recommend NT-MDT users and prospective customers to contact official representative only at: http://www.ntmdt-si.com/distributors.
We would like to assure NT-MDT community that our team will continue to work hard to ensure smooth transition, delivery of services, represent their interests and achieve best outcomes for all.
NT-MDT SI Participates at mmc2017
NT-MDT Spectrum Instruments were proud to participate at mmc2017 one of Europe’s largest exhibition dedicated to microscopy and imaging. The Microscience Microscopy 2017 was held at Manchester Central Convention Complex July 03rd- 06th 2017. A total of 1340 people registered to attend mmc2017 which is the latest in an impressive list of events dating back to the 1960’s starting with the Micro conference and exhibition series. This later became Microscience which grew ever-bigger until 2010. The RMS hosted the European Microscopy Congress in 2012 which was the catalyst for the current Microscience Microscopy Congress series.
NT-MDT SI has a unique and unrivalled portfolio of scanning probe microscopes, from cutting edge scientific research to routine surface investigations. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics. As an innovator in SPM for over 20 years, NT-MDT SI has a specialised high-performance solution for your research needs.
Dr Sergey Lemeshko Head of European Sales at NT-MDT SI performed live demonstrations on our highest performance AFM TITANIUM. The TITANIUM Atomic Force Microscope (AFM) incorporates revolutionary developments of NT-MDT SI to provide the highest level of performance and ease of use. Featuring the Revolution Cartridge for Multi-probe Cartridge operation and innovative HybriD mode paired with low noise and low drift performance TITANIUM sets a new standard in atomic force microscopy. Please find more details about this revolutionary AFM here http://www.ntmdt-si.com/automated-afm/titanium
NT-MDT SI was also involved in the Pre-Congress SPM workshop “Practical Tips for AFM Imaging and Spectroscopy”. The workshop provided an advanced in depth introduction to SPM at a level suitable for graduate students who have started using or developing SPM in their own research, and for experienced electron and optical microscopists who would like to know how they could use SPM.
NT-MDT SI would like to thank all those that took the time to visit our booth #714 at mmc2017 and look forward to meeting you at future events and workshops.
Please follow this link to find out more information on future NT-MDT SI Workshops & Events
NT-MDT SI participates at 3rd Bologna SPM Workshop
NT-MDT Spectrum Instruments are proud to announce their participation at the 3rd Bologna SPM Workshop in association with our Italian partners Pra.Ma. This one day workshop will take place in the University of Bologna, Italy on July 14th 2017.
Representing NT-MDT Spectrum Instruments at this workshop is Dr Sergey Lemeshko which is the Head of European Sales who will deliver a talk on “Material contrast mapping with nanometer resolution by Apertureless Scanning Near-Field Microscopy”. Dr Lemeshko will deliver his talk in the morning session of the workshop as part of the Innovations in Scanning Probe Microscopy between 12.40-13.00hrs. Alongside Dr S. Lemeshko will be Dr V. Polyakov Head of R&D at NT-MDT Spectrum Instruments.
From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.
To view full details of the Programme for this workshop please visit our website via the following link http://www.cristallografia.org/uploaded/4072.pdf
For more details on NT-MDT Spectrum Instruments devices and upcoming Events please visit http://www.ntmdt-si.com/