AFM & nano-Spectroscopy Systems

  
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CSG30/Pt

CSG30/Pt/15 (15 separated chips): $385 (Add to cart)
CSG30/Pt/50 (50 separated chips): $1,015 (Add to cart)

High Resolution CONTACT/SEMICONTACT "GOLDEN" Silicon Cantilevers CSG30 series with PtIr conductive coating.

Due to the medium meanings of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.

PROBES GENERAL INFORMATION

 

CSG30/Pt series specification

 

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

PtIr

Conductive coating

PtIr (25nm), Cr adhesion layer (25A)

Cantilever number

1 rectangular

Tip curvature radius

~ 35nm

Available CSG01 probe

bare, tipless, with Al reflective coating

 

 

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

CSG30

190

30

1.5

26

48

76

0.13

0.6

2

 

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