CSG30/Pt
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High Resolution CONTACT/SEMICONTACT "GOLDEN" Silicon Cantilevers CSG30 series with PtIr conductive coating.
Due to the medium meanings of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.
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PROBES GENERAL INFORMATION
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CSG30/Pt series specification
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Material
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Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
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Chip size
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3.4x1.6x0.3mm
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Reflective side
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PtIr
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Conductive coating
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PtIr (25nm), Cr adhesion layer (25A)
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Cantilever number
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1 rectangular
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Tip curvature radius
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~ 35nm
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Available CSG01 probe
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bare, tipless, with Al reflective coating
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Cantilever series
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Cantilever length, L±5µm
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Cantilever width, W±3µm
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Cantilever thickness,
T±0.5 µm
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Resonant frequency, kHz
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Force constant, N/m
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min
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typical
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max
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min
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typical
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max
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CSG30
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190
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30
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1.5
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26
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48
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76
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0.13
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0.6
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2
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