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Test samples
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Long-life, stable and non-destructing object for AFM.
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6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement
in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
half-monolayer high (0.75 nm) steps.
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6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of
monolayer high (1.5 nm) steps.
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Test pattern for Piezoresponce Force Microscopy
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