AFM probes for Magnetic mode (MFM) with CoFe magnetic coating.
(50 separated chips):
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AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with CoFe layer for MFM measurements.