VIT_P/IR
| TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series |
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
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Image in optical microscope
(TOP VISUAL probe is under the investigated sample).
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Topography image of the sample made by TOP VISUAL probe.
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VIT_P series specification
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Material
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Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
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Chip size
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3.4x1.6x0.3mm
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Reflective side coating
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Al
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Front coating
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None
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Cantilever number
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1 rectangular
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Tip curvature radius
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typical 30nm
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Tip shape
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Pyramidal
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Tip height
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14-16 um
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Cantilever series
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Cantilever length, L±5µm
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Cantilever width, W±3µm
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Cantilever thickness,
T±0.5 µm
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Resonant frequency, kHz
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Force constant, N/m
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min
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typical
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max
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min
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typical
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max
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VIT_P/IR
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140
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50
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5.0
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200
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300
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400
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25
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50
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95
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