AFM & nano-Spectroscopy Systems

  
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VIT_P/IR

VIT_P/IR/15 (15 separated chips): $433 (Add to cart)
VIT_P/IR/50 (50 separated chips): $1,271 (Add to cart)
TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series

 TOP VISUAL probes intended:
1.  For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

 

 

 

Image in optical microscope
(TOP VISUAL probe is under the investigated sample).

 

 


Topography image of the sample made by TOP VISUAL probe.

 

VIT_P series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side coating

Au

Front coating

None

Cantilever number

1 rectangular

Tip curvature radius

typical 30nm

Tip shape

Pyramidal

Tip height

14-16 um

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

VIT_P/IR

140

50

5.0

200

300

400

25

50

95

 

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