AFM & nano-Spectroscopy Systems

  
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VIT_P_C/Pt

VIT_P_C/Pt/50 (50 separated chips): $1,983 (Add to cart)
VIT_P_C/Pt/15 (15 separated chips): $656 (Add to cart)
TOP VISUAL CONTACT Silicon Cantilevers VIT_P_C/Pt series

 TOP VISUAL probes are intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

 

 

 

Image in optical microscope
(TOP VISUAL probe is under the investigated sample).

 

 


Topography image of the sample made by TOP VISUAL probe.


This model includes:
1. Tip-side conductive cover made of Pt;
2. Reflection-side cover for better AFM laser reflection made of Pt

 

VIT_P series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side coating

Pt

Front coating

Pt

Cantilever number

1 rectangular

Tip curvature radius

25 - 35 nm

Tip shape

Pyramidal

Tip height

14-16 um

 

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

VIT_P_C/Pt

450

50

2.5

8

16

25

0.3

0.6

1

 

 

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