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Colloidal probes for Force Modulation Mode
Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as “Colloidal Probes” and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The tip is formed using a spherical, colloidal particle that is attached to a tipless cantilever. Сolloidal probes are manufactured in the state-of-the-art clean room using micromachining techniques and a high precision, 6 axis, micromanipulator stage system. Near perfect micro-spheres of various materials are attached at the end of tipless cantilevers using a proprietary, clean, contamination free process. Colloidal Probe Application
Colloidal Probe applications include direct surface force measurement, colloidal interactions on the single particle-particle level, direct measurement of cell mechanics, measurement of adhesion forces, study of colloidal interactions between particle and surface. These are just a few application out of a fast growing field using colloidal probe technique.
Colloidal Probe Specification
Tipless cantilever specification:
Ordering code:
CPFM _ SiO2 - A / Au / 5
PROBE SERIES _ TYPE OF SPHERES – SIZE / Reflective Coating / ORDERING NUMBER
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