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Catalogue
Product name
Description
Cost
Quantity
Summary cost
SNOM_NC/10
(10 separated chips)
SNOM aperture cantilevers for semicontact mode
2.190 €
4.380 €
SiC/0.75
(SiC calibration sample with steps 0.75 nm.)
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of half-monolayer high (0.75 nm) steps.
150 €
150 €
HA_CNC/15
(15 separated chips)
High Accuracy Contact AFM probes HA_CNC series, each chip has 2 cantilevers, resonant frequency 46 kHz / 66 kHz, force constant 1.0 N/m / 1.5 N/m.
310 €
310 €
Total price:
4.840 €
PROMO Code:
Delivery method: By courier:
90 €
TOTAL:
4.930 €
Country of delivery:
Buelorussia
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