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Product name Description Cost Quantity Summary cost
SiC/0.75
(SiC calibration sample with steps 0.75 nm.)
6H-SiC(0001) based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in several nanometers interval. The simplicity of calibration process is provided by nearly uniform distribution of half-monolayer high (0.75 nm) steps.
 150 € 150 €
Total price: 150 €
PROMO Code:
Delivery method: By courier: 85 €
TOTAL: 235 €
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Estonia
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