NT-MDT Spectrum Instruments – research, production, sales and support  of wide range AFMs and AFM-Raman-Nano-IR Systems


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MRS 2016

NT-MDT Spectrum Instruments is excited to take part at MRS Fall Meeting & Exhibit 2016 November 27 – December 2 in Boston, Massachusets.

Location: Hynes Convention Center
Level 2,
900 Boylston Street
Boston, Massachusetts 02115
Booth Number: 923

The increasingly cross-disciplinary worldwide activity in materials research manifests itself every year in the MRS Fall Meetings. Featuring over 50 symposia and attended by as many as 6,000 researchers from every corner of the globe, the annual Fall Meeting in Boston’s Hynes Convention Center and Sheraton Boston Hotel is the preeminent annual event for those in the field of materials research.

Please, visit us at Booth 923. Our engineers will be glad share with you our news and latest developements, to demostrate work of our AFM equipment and to provide our visitors free samples of Golden (NSG10, CSG01) and Etalon (HA_NC, HA_C) series cantilevers.

2016 MRS Fall Meeting


Single crystal diamond AFM probes with high aspect ratio


We’re glad to present the new product in our assortment: AFM cantilevers with single crystal diamond (SCD) tips. This type of probes is represented by a very narrow diamond (CVD-grown) needle glued to a standard tipless Si cantilever.

AFM probes prepared by such technology show several features, especially relevant to AFM scans:

  • SCD tip’s cone angle is less than 10 degrees. Thus a diamond needle will get into deep trenches and between high particles, providing detailed topography images.
  • Single crystal diamond tip’s end is very hard. As the result wear of such cantilevers is several times slower than for standard silicon ones. Low deformation of a tip will be the great utility for elasticity investigations and simple nanoindentation or force lithography experiments.
  • SCD tip has got low surface energy and it works well for sticky biological samples.

SCD AFM cantilevers are constantly used by our best application scientists: Sergey Magonov and Marko Surtchev. Thus we’re absolutely sure in quality of these probes.

To the right you can see a scan of so-called “Black silicon” relief. Such surface can be constructed by a special etching experiment and is used in solar cells.

Main challenges in visualization of “black silicon” pyramids are their heights that reach 6-7 um. Standard cantilever can’t get between such high and densely grown structures. But as the one may see from the scan, SCD probes worked well. Sharp pyramid’s shape and well-defined flat areas between them approve high quality of the scan.

Now SCD cantilevers are presented in our assortment by the models NSG30/SCD and FMG01/SCD with the same lever’s parameters as for corresponding ones of Golden series. But by the request SCD needles can be glued to any types of tipless cantilevers of Golden and Etalon series.

Also we provide an additional discount 15% for any models of SCD probes till the end of October 2016.

NT-MDT microscopes were involved into more than 1000 scientific researches in 2015
Over 1000 articles written with help of NT-MDT microscopes were published in year 2015 in top scientific journals with average impact factor of 3,2. List of selected papers can be found here.
AFM cantilevers with conductive coating TiN
We’re glad to announce that AFM probes with titanium nitride (TiN) coating appeared in our assortment again.
High hardness of this material and its melting temperature around 3500 C provides its utility in wide range of applications.
Our practice of AFM measurements shows that thin films of TiN spread over AFM cantilever’s tip’s end are stable in high currents and any standard force loads that arise in the contact AFM technique. Our first cantilevers with conductive TiN coating were prepared and investigated in 1998 as the result of the common project of NT-MDT and State Research Institute for Problems in Physics (V. Shevyakov, S. Lemeshko, V. Roschin. Conductive SPM probes of base Ti or W refractory compounds. Nanotechnology, 9 (1998) 352-355).
Since July TiN coated AFM cantilevers are presented in our stock by models: NSG01/TiN and FMG01/TiN. If you need AFM probes with other resonance and stiffness parameters, please, don’t hesitate to write to Lisov@ntmdt.ru (Evgeniy Lisov). In future we’re going to extend TiN assortment over all models of Golden series.
Refreshing our production range we also announce the new special: with any offer made in August the one may claim to try conductive TiN cantilevers. And we will send a test box of three NSG01/TiN or FMG01/TiN probes for free. We will also appreciate if you share with us your opinion after trying these probes later!


Kavli Prize in Nanoscience

Sincere congratulations to G.Binning,C.Gerber and C.Quate with #Kavli2016 Nanoscience Award for the invention and realization of atomic force microscopy, a breakthrough in measurement technology and nanosculpting that continues to have a transformative impact on nanoscience and technology!

NT-MDT presents conductive probes with the modified coating W2C+

Due to volume doping with anticorrosion elements the new coating W2C+, which was earlier proven to be stable under high currents and pressures, may also work for a long time in high humidity atmosphere.

Several experiments were carried out to check the result. Two sets of probes coated by W2C and W2C+ layers correspondingly were being placed into atmosphere of more than 90% humidity for several days. Performance capabilities of the probes were tested by current-voltage curves and scans on HOPG. Before being held in humid air all cantilevers worked correctly showing good conductivity. But already after 8 days old-type coating have lost their conductive properties. The same time probes W2C+ didn’t stop conducting even after 16 days of storage in 90% and more humidity.

We’re also delighted to announce that since June 2016 we will sell only new W2C+ probes from our web-site. The same time, cost of this model stays the same.
More of all, we will be glad if our customers try these probes’ possibilities on practice. When the one orders any model of conductive probes from our web-site (http://www.ntmdt-tips.com/) this summer we will add to the order a test box of 3 cantilevers HA_C/W2C or HA_NC/W2C at choice.

For more information - please, visit NT-MDT main web-site.

Workshop Announcement Rome Italy 2016

NT-MDT is excited to announce an upcoming workshop for Italian customers to be held in Rome, Italy June 17th 2016. The Workshop will take place at the GRAND HOTEL PALATINO, Rome, Italy, June 17th 2016 focusing on techniques of AFM, Raman and Techniques of Advanced AFM, Super resolution imaging – Tip Enhanced Raman Scattering (TERS).

During this arrangement CEO of NT-MDT America., Dr. Sergey Magonov (CEO of NT-MDT America), will present a talk on Compositional imaging of complex materials with atomic force microscopy. Our application scientist, Dr Sergey Lemeshko, will also present a talk on reliable TERS probes based on Si-cantilevers for nanoRaman imaging and nano-IR sSNOM.

As a practical part we will provide and demonstrate measurements on the Ntegra Platform, and TITANIUM devices.

On our main web site you may find more information about the workshop and our contact persons. 

Upcoming webinar of Dr. Stanislav I. Leesment

25 of May 2015 the new webinar of Dr. Stas Leesment will take place. During this webinar various examples of common image processing procedures such as flattening, filtering, etc. will be described and the ways of perceptual data representation will be shown.

To find more information about the webinar and to pass the registration procedure, please, visit "Webinars" section of our web-site

NTEGRA Spectra II - automated AFM-Raman, SNOM and TERS system

NT-MDT is delighted to introduce our new product NTEGRA Spectra II. Owing to Tip Enhanced Raman Scattering (TERS) the new model allows carrying out spectroscopy/microscopy with nanometer scale resolution.
Scanning near-field optical microscopy (SNOM) is another approach to obtain optical and spectroscopy images of optically active samples with resolution limited by probe aperture size (~ 100 nm).

To find more information about applications, working principles and technical specifications of NTEGRA Spectra II you may visit its section on our web-site.

Lecture with Dr. Sergei Magonov in CNSI

CNSI Core Technology Centers Advances in Instrumentation

Seminar hosted by the Nano Pico Characterization Lab with Dr. Sergei Magonov

When: Tuesday May 3rd at 2 PM
Where: CNSI Executive Conference Room
Please RSVP by contacting


Click here for more information

E-MRS 2016

NT-MDT will take part at the 2016 E-MRS Spring Meeting and Exhibit in Lille (France) from 2nd until 6th of May 2016. Visit us at booth No 79 & 80 to get a unique look at our Titanium and Solver Next devices.
The conference will include 31 parallel symposia, 3 workshops & tutorials, one plenary session, one exhibition and much more. All technical sessions and non-technical events will be held at Lille Grand Palais.

Please visit the E-MRS website for online registration before April 18th to avail of this great opportunity to see the latest in AFM innovation for yourself. 

New model of Etalon probes for both contact and amplitude modultation mode

We are pleased to introduce HA_CNC, a new model in our range of AFM probes.

HA_ CNC cantilever probes are designed in such a way as to maintain a balance between the quality factor and a stiffness constant. Each chip has two cantilevers with resonant frequencies 46 and 66 kHz, which are suitable for use in intermittent-contact mode

HA_CNC series.

6th edition of Graphene Conference series

NT-MDT would like to announce our participation at the 6th edition of Graphene Conference series, the largest European Event in Graphene and 2D Materials. The exhibition will take place from the 19th until the 22nd of April 2016 in Genoa (Italy).

Attending the conference will be Dr Sergey Lemeshko, Regional Sales Manager for NT-MDT Europe and Sinead Quinn, Customer Relationship Marketing Coordinator. Visit our booth to get a unique look at a Solver Nano and see the latest in AFM innovation for yourself.

So visit the Graphene Conference website now and register, we look forward to seeing you at Booth 17.


New Etalon AFM probes for magnetic measurements

NT-MDT is pleased to announce a new range of polysilicon ETALON AFM probes with CoFe coating for high-resolution magnetic force microscopy. These probes combine the advantages of ETALON series and excellent characteristics of the new CoFe coating.

HA_FM/CoFe series.

Spectrum Instruments Ltd. - new exclusive distributor of NT-MDT accessories

We are pleased to inform you that from January 1st 2016 all sales of our NT-MDT accessories will be performed via global exclusive distributor Spectrum Instruments Ltd. This change will not affect the service you receive in any way. Your rights under existing warranties and agreements are not affected.

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