AFM & nano-Spectroscopy Systems

  
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News

14.10.2011
New TGZ4 grating

TGZ4 - new calibration grating in the TGZ series is available now! Step height 1317nm, period 3um.

12.09.2011
ProIMAGE Contest 2011 is open!
NT-MDT invites the customers to take part in the ProIMAGE Contest 2011. Every month the author of the best image gets USD 1000!
22.06.2011
New website
Welcome to our newly redesigned website! 
Knowing the value of your time, we’ve rebuilt our site to make it much easier to find and buy high-quality NT-MDT probes and accessories.
We hope you find the changes useful.
10.06.2011
SiC sample
New products -  Silicon Carbide sample for accurate small scale calibration of AFM scanners with near uniform distribution of half-monolayer high (0.75 nm) or monolayer high (1.5 nm) steps.
15.02.2011
From 02/15/2011 to 03/15/2011 buy any "Whisker Type" probes ...

 From 02/15/2011 to 03/15/2011 buy any "Whisker Type" probes with 15% discount and get free 4 Gb USB flash drive with calibrated SEM photo for each "Whisker Type" tip

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