NT-MDT Spectrum Instruments – research, production, sales and support  of wide range AFMs and AFM-Raman-Nano-IR Systems

            

SiGe buffer layer 1

SiGe buffer layer containing about 50-54 % Ge after the chemical treatment
Author: Mr. Mikhail V. Shaleev
Organization: Institute for Physics of Microstructures RAS
Scan size: 7 х 7 μm
Probes used: NSG01
Copyright © 1998 - 2025, NT-MDT SI