AFM & nano-Spectroscopy Systems

  
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NSG01_Ed

NSG01_Ed/15 (15 separated chips): $354 (Add to cart)
NSG01_Ed/50 (50 separated chips): $1,002 (Add to cart)
High Resolution NONCONTACT "GOLDEN" Silicon AFM Probes NSG01 series with special alignment grooves for easy chip adjustment and laser alignment in SOLVER NANO and NANOEDUCATOR II microscopes (NT-MDT Spectrum Instruments)


PROBES GENERAL INFORMATION
 

NSG01_Ed series specification

Material

 
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size
3.4x1.6x0.3mm
Reflective side
Al
Cantilever number
1 rectangular
Tip curvature radius
typical 6nm, guaranteed 10nm
Available coatings
conductive PtIr, magnetic CoCr

 

Cantilever series

 
Cantilever length, L±5µm
Cantilever width, W±3µm
Cantilever thickness,
T±0.5 µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
NSG01_Ed
125
30
2.0
87
150
230
1.45
5.1
15.1

 

 

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