NT-MDT supply with high resolution SPM probes for the main SPM modes.
The probes are supplied with and without reflective coating, with conductive and magnetic coatings to cover the greater part of SPM application range.
Extremely sharp tips allow to obtain high-quality images of your samples.
Probes have standard chip size that makes them compartible with the devices of the most SPM manufactures.

Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long lifetime due to the high material durability.

"Whisker Type" probes are specially designed for researching deep trenches and control of near vertical sidewalls. Any inclination angle to match the SPM holder specification and different Whisker tip length can be produced at customer's requirement.

The ideal probe for making AFM Oxidation Nanolithography

Stable and nondestructive,wear resistant probe with conductive diamond coating

allows you to make as many images as you want.

Company NT-MDT supply with the SNOM probes for Scanning Near Field Optical Microscopes.

Company NT-MDT supply with Highly Oriented Pyrolytic Graphite (HOPG).  It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunneling microscopy.
Such HOPG properties as atomic plane surface and good conductivity make it the best material for STM calibration and the excellent substrate for different samples. HOPG is a material that consists of many atomic layers of carbon highly oriented among each other. HOPG is manufactured at the temperature of 3273K and remains stable at the temperatures up to 2000°C in the inert environment. The parallelism of atomic layers is characterized by "mosaic spread angle". The less this angle the higher the quality of HOPG is.